Non-Contact Topography Measurement WorkshopO NCTMW, será um evento realizado pelo CT-TRIB com apoio da Polytec GmbH que abordará e demostrará os mais recentes recursos para medições de topografia sem contato através de: interforemetria de coerência de grandes áreas / macro / micro.
* 13:30-15:00 - Palestra (40 vagas) * 15:00-17:00 - Demostrações de análise ao vivo (10 vagas, selecionados internamente pelos organizadores)
***ATENÇÃO: O EVENTO SERÁ INTEIRAMENTE EM INGLÊS***
Surface profilers from Polytec are innovative, high-precision and non-contact sensor systems for characterizing the entire surface topography of a workpiece or a microstructure in 3D areal. The TopMap line of optical profilers are based on the principle of coherence scanning interferometry, also known as white light interferometry or vertical scanning interferometry or coherence radar. With their innovative continuous scanning technology, proving both large vertical range, nanometre resolution and the ability of areal measurement for both small and large samples or multi-sample measurements in a single shot, these optical measurement tools are perfect for measurement laboratories or any production testing needs. Use TopMap optical profilers for non-contact fast and stable measurements of key surface parameters such as roughness, flatness, step height and critical dimensions of 3D areal structures. The workshop is planned to cover the following subjects:
1 - Principles and Practices
Speaker: Joe Armstrong, Polytec GmbH, Germany
Program:
13:30 — 15:00 Talk (extended group, maximum 40 participants)
Where: Ceme-sul
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